Abstract
Under limited resources, the widely used Vtq-optimal test
plan determines the sample size, termination time, and number of
measurements by minimizing the approximate variances of the estimated q-quantile, tq, for highly reliable products.
This approach is
economically efficient when the Vtq-optimal test plan simultaneously
satisfies another optimality criterion through an appropriate choice of
q. Therefore, we theoretically study a bi-optimal quantile-based test
plan based on a Wiener process, which achieves 100% efficiency for
two optimality criteria.
The necessary and sufficient conditions for
its existence and uniqueness are derived, which can then be used to
determine the optimal test configuration for accelerated degradation
tests. Two numerical examples are presented to illustrate the practical applicability of the proposed bi-optimal quantile-based test plan.
Key words and phrases: Cost-constrained optimization, D-optimal frequency, inverse Gaussian distribution, monotonicity, signal-to-noise ratio
Information
| Preprint No. | SS-2025-0285 |
|---|---|
| Manuscript ID | SS-2025-0285 |
| Complete Authors | Ya-Shan Cheng, Chien-Yu Peng |
| Corresponding Authors | Chien-Yu Peng |
| Emails | chienyu@stat.sinica.edu.tw |
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Acknowledgments
The authors are grateful to the Editor, the Associate Editor, and anonymous referees for their insightful and constructive comments. This work of
Ya-Shan Cheng and Chien-Yu Peng was supported in part by the National
Science and Technology Council of Republic of China (Taiwan) under Grant
Number NSTC-114-2118-M-008-003-MY2 and NSTC-112-2118-M-001-005-
MY2, respectively.
Supplementary Materials
The online Supplementary Material contains the Fisher information matrix
of the accelerated degradation model based on a Wiener process, the proofs
of Theorems 1, 3, 4, Corollaries 1, 2, Proposition 1 and the derivation of
(4.5).