Abstract: Mukerjee and Tang (2012) established the K-aberration criterion for baseline two-level designs. This paper explores the use of the regular fractions of two-level designs (2^m-p designs) to create baseline designs. Results are presented that establish relationships between the sequence of K-values for a baseline design and the word length pattern of the corresponding 2^m-p design. Based on these results, methodology for creating baseline designs that have good K-aberration characteristics is developed and demonstrated.

Key words and phrases: Baseline parameterization, minimum aberration, orthogonal array, regular design, word length pattern.