2022 Workshop on
Advances in Reliability

Institute of Statistical Science, Academia Sinica Graduate Institute of Statistics National Central University Department of Statistics and Institute of Data Science, National Cheng Kung University

Program


ISS

Nov. 17 Thursday

17:30-18:00 Registration
18:00-19:30 Welcome Reception

(By invitation only)

2F Recreation Hall (R216 交誼廳)

19:30-21:00
Talk 1 Chair: Shuen-Lin Jeng

William Q. Meeker (On-Line)

B1F Lecture Hall (R101演講廳)

Modern Methods for Estimating Fatigue Life and Fatigue Strength Distributions from Fatigue Experimental Data

ISS

Nov. 18 Friday

09:00-09:30 Registration
09:30-09:40 Opening

B1F Lecture Hall (R101演講廳)

09:40-10:40
Talk 2 Chair: Tsai-Hung Fan

Sheng-Tsaing Tseng

A Multi-Run Step-Stress Experiment for Rechargeable Batteries

10:40-11:00 Coffee Break

2F Recreation Hall (R216 交誼廳)

11:00-12:00
Talk 3 Chair: Sheng-Tsaing Tseng

Tsai-Hung Fan

A Complete Bayesian Degradation Analysis Based on Inverse Gaussian Processes

12:00-13:30 Lunch Break

(R216 交誼廳、R102、R106、R109)

13:30-15:00
Session I (演講)

Industrial scene

B1F Lecture Hall (R101演講廳)

Chair: Chien-Tai Lin

Speaker 1. Alex Chen

大數據信貸風控

Speaker 2.Shih-Chung Chuang

Practice of Statistics in Industrial Manufacturing

Speaker 3. Wei-Ming Li

Data Application in Sustainable Carbon Management

Session III (座談)

Recent developments and applications of inference and design in degradation tests

3F Meeting Room (R308會議室)

Speaker 1. Chih-Chun Tsai

Speaker 2. Yi-Fu Wang

Optimal Design for Trend Inverse Gaussian Process Model

Speaker 3. I-Chen Lee

Review of Optimal Design of Accelerated Degradation Tests

Speaker 4. Hung-Ping Tung

The Applications of General Equivalence Theorem on Planning Accelerated Degradation Tests

15:00-15:20 Coffee Break

2F Recreation Hall (R216 交誼廳)

15:20-16:50
Session II(演講)

Advances in degradation analysis

B1F Lecture Hall (R101演講廳)

Chair: Su-Fen Yang

Speaker 1. Yufen Huang

Influence Analysis on Stochastic Process Models

Speaker 2. I-Tang Yu

A Bayesian Approach to Sequential Updating Lifetime Information in Degradation Analysis

Speaker 3. Ming-Yung Lee

Optimal Design of Accelerated Degradation Tests Based on Exponential-Dispersion Degradation Model

Session IV (座談)

Reliability demands and solutions for current products and systems

3F Meeting Room (R308會議室)

Speaker 1. Cher-Ming Tan

Speaker 2. David Shan-Hill Wong

魔鬼在細節中--電池衰變實驗充放曲線微特徵變化

Speaker 3. Shuen-Lin Jeng

A discussion on experimental and screening methods for battery degradation on second-life of Li-ion batteries

Speaker 4. Kuan-Jung Chung

Prognostics of Lithium-Ion Battery

16:50-17:00 Closing
17:30- Banquet
(By invitation only)