Back To Index Previous Article Next Article Full Text

Statistica Sinica 26 (2016), 745-759 doi:http://dx.doi.org/10.5705/ss.202014.0099

USING REGULAR FRACTIONS OF TWO-LEVEL DESIGNS
TO FIND BASELINE DESIGNS
Arden Miller and Boxin Tang
University of Auckland and Simon Fraser University

Abstract: Mukerjee and Tang (2012) established the K-aberration criterion for baseline two-level designs. This paper explores the use of the regular fractions of two-level designs (2m-p designs) to create baseline designs. Results are presented that establish relationships between the sequence of K-values for a baseline design and the word length pattern of the corresponding 2m-p design. Based on these results, methodology for creating baseline designs that have good K-aberration characteristics is developed and demonstrated.

Key words and phrases: Baseline parameterization, minimum aberration, orthogonal array, regular design, word length pattern.

Back To Index Previous Article Next Article Full Text