Reliability and Lifetime Inferen

3:10－5:10 p.m. Reliability and Lifetime Inference

	Reliability and Lifetime Inference Organizer: Sheng-Tsaing Tseng (National Tsing Hua University, Taiwan, R.O.C.) Email: sttseng@stat.nthu.edu.tw Chair: Sheng-Tsaing Tseng (National Tsing Hua University, Taiwan, R.O.C.) Email: sttseng@stat.nthu.edu.tw
	3:10－3:40	Speakers: Shung-Lin Jeng Department of Statistics, Tunghai University, Taiwan, R.O.C. Email: sljeng@thu.edu.tw Title: Some Degradation Measurements and Models in Nano Reliability
	3:40－4:10	Loon-Ching Tang Department of Industrial & Systems Engineering, National Singapore University, Singapore. Email: isetlc@nus.edu.sg Title: A Sequential Bayesian Approach for Analyzing ALT Data
	4:10－4:40	Sheng-Tsaing Tseng Institute of Statistics, National Tsing Hua University, Taiwan, R.O.C. Email: sttseng@stat.nthu.edu.tw Title: Model Discriminations in Degradation Analysis
	4:40－4:55	Indrani Basak Penn State Altoona, Altoona, U.S.A. Email: i8b@psu.edu Title: Inference on Three-parameter Gamma Distribution Based on Progressively Censored Data
	4:55－5:10	Chih-Hsiang Ho Department of Mathematical Sciences, University of Nevada, Las Vegas, USA Email: chih-hsiang.ho@unlv.edu Title: ARIMA Models for Forecasting Poisson Process Observations: Reliability and Quality Control